Textbook

Books Price Comparison (Including Amazon) - Guaranteed Lowest Prices on Books


 

VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)

 
 
 
 
VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
Author: Laung-Terng Wang - Cheng-Wen Wu - Xiaoqing Wen
ISBN 13: 9780123705976
ISBN 10: 123705975
Edition: 1
Publisher: Morgan Kaufmann
Publication Date: 2006-07-21
Format: Hardcover
Pages: 808
List Price: $89.95
 
 

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.