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X-Ray Spectrometry in Electron Beam Instruments

 
 
 
 
X-Ray Spectrometry in Electron Beam Instruments
Author: N/A
ISBN 13: 9780306448584
ISBN 10: 306448580
Edition: 1995
Publisher: Springer
Publication Date: 1995-03-31
Format: Hardcover
Pages: 372
List Price: $239.00
 
 

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Booknews

A collection of papers derived from a special symposium held at the Microbeam Analysis Society Meeting of 1993 in Los Angeles, providing an overall view of current research in the field of x-ray spectrometry as it relates to the practice of electron probe x-ray microanalysis. Among the topics are the development of energy dispersive electron probe analysis; problems and trends in x-ray detector design for microanalysis; germanium x-ray detectors; modeling the energy dispersive x-ray detector; improving EDS performance with digital pulse processing; a review of wavelength dispersive spectrometry; and an evaluation of quantitative electron probe methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)