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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

 
 
 
 
Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
Author: Joseph Goldstein - Dale E. Newbury - David C. Joy
ISBN 13: 9780306472923
ISBN 10: 306472929
Edition: 3rd
Publisher: Springer
Publication Date: 2007-04-30
Format: Hardcover
Pages: 689
List Price: $99.00
 
 

The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray spectral measurement, x-ray analysis, specimen preparation, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition. Annotation (c)2003 Book News, Inc., Portland, OR