The second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis available today.
An overview of electron beam instruments and techniques of microstructural analysis, for researchers, senior undergraduates, and graduates in materials science. Covers fundamental principles and practical aspects of techniques including transmission electron microscopy (TEM), scanning TEM, conventional and convergent electron diffraction, Auger electron spectroscopy, and electron probe microanalysis. Appendices offer tables of X-ray and EELS energies, Kikuchi maps, and the reciprocal lattice. Includes b&w photos. Annotation c. Book News, Inc., Portland, OR (booknews.com)