With over 170 pages of new material, the second edition of this widely used reference provides engineers and statisticians with an updated, easy-to-follow approach to evaluating and projecting component and system reliability by combining standard statistical methods with advanced leading-edge reliability techniques. It includes an extensive treatment of life distribution and accelerated testing models and data analysis and data simulation techniques, as well as quality control methods and algorithms used to predict component and assembly field reliability.
The second edition includes three completely new chapters: two cover "Repairable System Reliability" (both for renewal and non-renewal models), with an emphasis on simple graphical techniques, while also describing analytical methods for reparable system data analysis. A third new chapter surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs.
In addition, this latest edition offers hundreds of new examples, exercises, problems, and references-all designed to provide readers with additional support in understanding and applying the latest reliability testing methods.
In bringing state-of-the-art techniques down to an accessible, how-to level, the second edition of Applied Reliability will serve the practical needs of electronic, mechanical, and industrial engineers involved in the design and manufacture of components and systems, and of statisticians and scientists working on applied reliability problems. It will also be a highly suitable textbook for engineering courses in applied reliability and quality control.
A revised and updated (1st ed., 1986) reference-text that provides engineers and statisticians with an approach to evaluating and projecting component and system reliability by combining standard statistical methods with advanced reliability techniques. This edition adds three new chapters, two of which cover Repairable System Reliability (for both renewal and non-renewal models), and the third of which surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs. There are also many new examples with detailed solutions, new exercises located throughout the text (many with answers given at the back), and additional problems following each chapter. Annotation c. Book News, Inc., Portland, OR (booknews.com)