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Statistical Analysis of Geographic Information with ArcView GIS And ArcGIS

 
 
 
 
Statistical Analysis of Geographic Information with ArcView GIS And ArcGIS
Author: David W. S. Wong - Jay Lee
ISBN 13: 9780471468998
ISBN 10: 471468991
Edition: 1
Publisher: Wiley
Publication Date: 2005-10-20
Format: Hardcover
Pages: 464
List Price: $150.00
 
 

Wong (earth systems and geo-information sciences, George Mason U.) and Lee (geography, Kent State U.) developed this text for quantitative methods classes introducing both statistical concepts and spatial statistical issues in geographic information systems. After the introduction, they present chapters on univariate distribution descriptors, bivariate relationship descriptors, hypothesis testers, point pattern descriptors and analyzers, line pattern analyzers, and polygon pattern analyzers. The CD-ROM contains all the ArcView 3.X software programs and datasets used in the instructional examples from the text. Annotation ©2005 Book News, Inc., Portland, OR